TS3USB221AQRSERQ1 TI
| Available |
TS3USB221AQRSERQ1 TI
• Qualified for Automotive Applications
• AEC-Q100 Qualified With the Following Results:
– Device Temperature Grade 1: –40°C to 125°C Ambient Operating Temperature Range
– Device HBM ESD Classification Level H2
– Device CDM ESD Classification Level C5
• VCC Operation at 2.5 V to 3.3 V
• VI/O Accepts Signals Up to 5.5 V
• 1.8-V Compatible Control-Pin Inputs
• Low-Power Mode When OE Is Disabled (1 µA)
• rON = 16 Ω Maximum
• ΔrON = 0.2 Ω Typical
• Cio(on) = 6 pF Typical
• Low Power Consumption (30 µA Maximum)
• High Bandwidth (900 MHz Typical)
• ESD Performance Tested Per JESD 22
– 7000-V Human-Body Model (A114-B, Class II)
– 1000-V Charged-Device Model (C101)
• ESD Performance I/O to GND Per JESD 22 – 12-kV Human-Body Model
• Qualified for Automotive Applications
• AEC-Q100 Qualified With the Following Results:
– Device Temperature Grade 1: –40°C to 125°C Ambient Operating Temperature Range
– Device HBM ESD Classification Level H2
– Device CDM ESD Classification Level C5
• VCC Operation at 2.5 V to 3.3 V
• VI/O Accepts Signals Up to 5.5 V
• 1.8-V Compatible Control-Pin Inputs
• Low-Power Mode When OE Is Disabled (1 µA)
• rON = 16 Ω Maximum
• ΔrON = 0.2 Ω Typical
• Cio(on) = 6 pF Typical
• Low Power Consumption (30 µA Maximum)
• High Bandwidth (900 MHz Typical)
• ESD Performance Tested Per JESD 22
– 7000-V Human-Body Model (A114-B, Class II)
– 1000-V Charged-Device Model (C101)
• ESD Performance I/O to GND Per JESD 22 – 12-kV Human-Body Model
Please make sure your contact information is correct. Your message will be sent directly to the recipient(s) and will not be publicly displayed. We will never distribute or sell your personal information to third parties without your express permission.
