LM2903QDRQ1 TI
| Available |
LM2903QDRQ1 TI
• Qualified for automotive applications
• AEC-Q100 qualified with the following results:
– Device temperature grade 0:
–40°C to 150°C ambient operating temperature range (LM2903E-Q1)
– Device temperature grade 1:
–40°C to 125°C ambient operating temperature range
– Device HBM ESD classification level H1C
– Device CDM ESD classification level C4B
• Improved 2 kV HBM ESD for "B" device
• Tri-Temp testing available for "B" device
• Single supply or dual supplies
• Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
• Low input bias current 3.5 nA typical ("B" device)
• Low input offset current 0.5 nA typ ("B" device)
• Low input offset voltage ±0.37 mV typ ("B" device)
• Common-mode input voltage range includes ground
• Differential input voltage range equal to maximumrated supply voltage ±36 V
• Output compatible with TTL, MOS, and CMOS
• Qualified for automotive applications
• AEC-Q100 qualified with the following results:
– Device temperature grade 0:
–40°C to 150°C ambient operating temperature range (LM2903E-Q1)
– Device temperature grade 1:
–40°C to 125°C ambient operating temperature range
– Device HBM ESD classification level H1C
– Device CDM ESD classification level C4B
• Improved 2 kV HBM ESD for "B" device
• Tri-Temp testing available for "B" device
• Single supply or dual supplies
• Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
• Low input bias current 3.5 nA typical ("B" device)
• Low input offset current 0.5 nA typ ("B" device)
• Low input offset voltage ±0.37 mV typ ("B" device)
• Common-mode input voltage range includes ground
• Differential input voltage range equal to maximumrated supply voltage ±36 V
• Output compatible with TTL, MOS, and CMOS
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